UNIVERSAL 3D PROFILOMETER
THAT CAN SEE IT ALL
NanoMap-D (Dual mode) takes imaging to next level. It brings competing techniques – contact and optical profilometer – on one platform. Automatic sample movement and one click measurement, makes NanoMap-D a step forward in imaging world.
Platform Advantages of combination 3D high resolution image Optical profilometer Contact profilometer
Software Computational power Applications
Misc. features
PlatformPlatform
1 Click movement between Optical and Contact Profiler head
The open platform architecture uses granite, optical flat reference disks. The tester allows upto 200mm scanning area (larger scanning range options available). NanoMap-D comes with antivibration table and acoustic enclosure to ensure complete noise elimination.
Advantages Of Contact + Optical Profiler
Combination is a necessity and not a luxury
By exploiting the advantages of both contact and non-contact based techniques for a comprehensive surface characterization NanoMap-D brings its user to a new level of measurement flexibility. The platform can analyse any kind of sample with ease (0% reflectivity, non flat samples etc.)
Advantages
Disadvantages
Optical
Profiler
Non contact
High sensitivity
High measurement speed
Material surface requirement
Limited surface slope
Contact
Highly reliable measurement
No material surface requirement
Higher spatial resolution
Contact to sample required
Lower measurement speed
OPTICAL PROFILOMETER FOR NON CONTACT 3D HD IMAGES
NanoMap-WLI – White light interferometer- brings high resolution. 4 million pixel image, large scanning range, customizable wavelength range to give users flexibility to image any kind of surfaces with ease.
Technical Specification 3D high resolution image Image Source Platform Imaging Modes
Multiple Turrets Software and Computational power Applications
Optical SpecificationOptical Specification*
Specifications that chases ever improving targets
AEP technology strives to improve technical specification with every day passing. For latest configuration and specifications please contact us.
Vertical Resolution 0.01nm
Turret upto 6 objective turret
Scan Range Up to 150mm x 150mm XY
Objectives 2.5x to 100x
Z focusing range 0.1 nm to 10mm
Tilt +/- 8 degree
Rotation (theta) 360 Degree
Pixel Standard 1024 x 1024, Optional 1536 x 1536 or 1920 x 1920
3D CONTACT PROFILOMETER WITH BOTH TIP AND STAGE SCAN MODES
NanoMap-LS with large scanning range allows to generate high resolution 3D and 2D images with a press of a button.
Tip and Stage Scan Modes Technical Specification 3D high resolution image Platform Software
Computational power Applications Misc. features
Tip And Stage Scan Mode
Tip scan (piezo drive) allows for best resolutions
Tip Scan using Piezo drive
Schematic to explain tip
Scan using Piezo drive Stage Scan using linear drive
Stage Scan using XY drive
NanoMap-LS allows for both tip and stage scan modes. Tip scan uses piezo drive to move the stylus upto 500x500micron area and generates ultra high resolution image. Stage scan moves the sample stage to generate high resolution image. As piezo stage has better XY accuracy tip scan produces far better image as compared to stage scan mode. With a click of button tip and stage scan modes can be selected on NanoMap-LS
Technical Specification
Vertical Resolution 0.1nm
Vertical Dynamic Range Up to 5um with fine range; up to 1300um with high range
Scan Range Up to 150mm x 150mm (upgrade available)
XY Piezo Stage Resolution 0.1um;
Stylus Loading Force 0.03mg to 100mg
Optical Camera Color camera with 1.5 x 1.5mm FOV
Illumination Bright and dark field illumination
SW settable intensity
UNIVERSAL TRIBOMETER
UT-3000 THAT DOES IT ALL
UT-3000 takes tribology and mechanical test to next level. A modular design allows same platform to perform several tests (rotary, fretting, reciprocating, linear, block on ring, indentation, scratch etc.) in controlled environmental condition.
Ultra Nano, Nano & Micro range Interchangeable test heads 3D high resolution image Various lower Drives Environmental Options
Close loop controls Sturdy platform Insitu Sensors FingerPrint curve Software
Applications Computational power Misc. features
Ultra Nano, Nano And Micro Range
Resolutions maintained over entire range
The modular based construction allows UT-3000 to accommodate various test heads on same platform. Easy to interchange heads allows UT-3000 to cover a range from nN to 5000N on same platform. User can run tests that require precision to study interaction at atomic level (thin films, dlc coatings, bio materials) or to test lubricants, automobile coatings etc. that requires heavy duty forces for several million cycles. Multiple heads ensure resolution independence from the load range.
Various Tests – Tribology, Indentation, Scratch, Mechanical Tests
Nano Load Range
Micro Load Range
Macro Load Range – upto 1000mN
– upto 30N
– upto 5000N
Interchangeable Test Heads
Comprehensive mechanical and tribological testing
UT-3000 offers following interchangeable techniques on same platform.
Main modules
Tribometer heads – High load tribology, Micro tribology , Nano Tribology
Other Modules
Indentation- Nanoindentation, Micro Indentation, Macro indentation
Scratch test- Macro scratch, Micro scratch, Nano Scratch
Mechanical test- Fatigue, creep, tensile, torsion, compression, bending etc
Various Lower Drives
Any motion can be replicated on UT-3000
Tribology depends on several parameters including the motion direction, speed etc. UT-3000 comes with various easily interchangeable lower drives such as rotary, fast reciprocating, block on ring, linear drive etc. to replicate any motion. It takes less than 5 minutes to interchange the lower drive. Choice of drive is dictated by the standard or the test required for eg. scratch test uses linear drive, fretting test uses fast reciprocating drive, pin on disk uses rotary drive and so on. All these drives are independently programmable i.e its easy to customize motions for eg. to simulate hip joint, tester can create a butterfly stroke (like number 8) with ease.
Environmental Options
Testing condition close to real life scenario
UT-3000 comes with close loop environmental control options. The wide range of computer controllable temperature ranges from -150C to 1500C, 5 to 95% RH . These chambers allow lab results to reproduce in field and also to design products considering different geographical location into consideration.
Close Loop Controls
Ensures high reproducibility and repeatability
UT-3000 uses multi mode real time Z down force control. Tests can be done on flat or non flat samples as down force is controlled during the test. All velocities, stroke length, temperature, humidity etc are controlled in close loop to ensure data repeatability and reproducibility.
Study Platform
No vibrations, clean room compatible
To allow analysis at nano level, NT-30 offers cut-off environment. NT-30 is based on a strong sturdy platform that uses granite, anti dampening cast iron, optically flat reference discs, anti-vibration table, acoustic enclosure etc. High grade electronics from silicon valley allow for high data processing speeds. Fine finish, clean room compatible, low energy compliant, small foot print, multiple cameras, led lighting on the platform makes this platform an ideal platform for various nanotechnology studies.
In-Situ Sensors
Multiple parallel data to increase result confidence
UT-3000 uses multi sensing technology to measure various data insitu during the test. Sensors such as acoustic emission, electrical contact resistance, down force, friction force, wear, displacement, humidity, temperature , velocity, stroke lengths, motion direction, images are all recorded and saved on same data file automatically. User can change the frequency of data collection to reduce file size if needed.
Speed/Load Graph
Finger Print Curve
Automatic generation of Friction vs velocity/load curve
To reduce guess work or to give a complete picture UT-3000 give users a starting point for any tribology test. It comes with standard recipe that allows automatic friction vs velocity/load curve generation at various environmental conditions. Tester automatically changes load and velocity during the test and produces the curves automatically. This curve should be used as a starting point for further specific experimental setups.
Software
Easy and intuitive software
Tester comes with latest windows based OS. It has an intuitive easy to run interface. With one click same area of sample moves between test and imaging head. After the data is collected, images are analyzed using powerful imaging software. Few features of software package is listed below
Real time display of friction, wear, force etc.
Automatic calculation of friction vs load/velocity curve
Herzian stress calculation
Easy to use interface to make new test methods
Several user defined channels
Data recorded at a very high frequency
Test in load or displacement controlled mode
Automatic presentation grade test report created
Data can be exported to any standard format including excel, ASCII etc.
Advanced statistical analysis software to compare various files
Applications
Usage limited only by user need
Few industries using UT-3000 are as following
Automobile/Aerospace
Clutches, tyre, paint, surface finish, piston liner, gears, glass, polymer etc.
Thin Films
DLC, CVD, ALD, electroplating, PVD, decorative coatings, solar cells, MEMS, etc.
Health Science / Biomedical
Joints, knee, bone, dental, skin, hair, sutures, stent, contact lens tissues, implants, pumps, lens etc.
Coatings
Hard coating, paint, protective coating, surface modifier etc.
Manufacturing
Cutting tool, surface inspection, wear volume, fretting, paint, surface finish, glass, polymer etc.
Chemicals
Lubricant, additives, metal working fluid, Anti friction coatings, etc.
Few of the several applications on the UT-3000 are mentioned below.
Ball/disk/ring/pin on disk/plate/ring/flat
Sliding/rolling wear
Fretting
Pin on Vee
Abrasive wear
Block on ring, bearing, ring on ring
Four ball test, EP wear, load bearing capacity
Cylinder on cylinder, piston ring liner
Scratch hardness, scratch adhesion
Hardness
Creep, tensile, compressive, fatigue, 3-4 point bending
Computational Power
High processing speeds
Strong hardware includes 64 bit, multiple core processors. The parallel processor configuration allows data processing independent of the number of channels being used. Tester comes with latest windows based OS.
UNIVERSAL NANO TESTER EXPANDS NANOTECHNOLOGY ANALYSIS
UNT-30 allows to do indentation and scratch in ultra-nano, nano and micro scale on same platform. With several new features and advanced high precision, the silicon valley design takes nanotechnology a step further.
Modular design to maintain high resolution across entire range
Modular based construction allows UNT-30 to control forces from nN to 30N on same platform.
Ultra Nano Load Range – upto 10mN
Nano Load Range – upto 500mN or 1000mN
Micro Load Range – upto 30N
Modular design allows to do several tests on one platform
NT-30 offers several complementing techniques on same platform. It takes less than 5 minutes to convert a scratch tester to a nanoindenter to a nanotribometer. This enables users to economically comprehensively characterize the material/coating etc.
Indentation Head
Indentation headCalculate hardness and modulus of thin films
Indentation is a century old technique where a sharp metal is indented on a test area to calculate hardness and Young’s modulus of the sample. Historically after the indent the dimension of the indent was measured to calculate hardness of sample. This introduced artifacts and error in data analysis.
UNT-30 uses insitu force and displacement sensors to generate force displacement curve that is used to calculate hardness and Young’s modulus automatically without the need to measure the indent dimension. Ultra precise electromagnetic actuators to apply force and multiple capacitance and lvdt sensors are used to measure displacement with very high accuracy. Tester has negligible thermal drift and compliance in Z direction. Indents can be done on micro scale using rockwell, brinell, Vicker’s and on nano scale using berkovich, cube corner etc. tips.
The choice of force range (ultra nano, nano or micro) is dictated by coating thickness and surface roughness.
Ultra Nano indenter
Nano indenter Range
Micro Indenter Range – upto 10mN force
– upto 500mN force
– upto 30N force (upgradeable with higher range)
Few features
Multiple indents on same or multiple samples with high accuracy
Depth measured using multiple independent capacitance sensors
Insitu force and displacement curves
Negligible thermal drift
Ultra high frame stiffness
Load and Displacement modes
Consolidated image and data
Scratch Head
Calculate adhesion and hardness of thin films
Scratch HeadScratch test is done to calculate adhesion and scratch hardness of coating or films. The test involves moving a sharp tip, typically a diamond tip, across the sample with controlled load profile (constant or increasing). The force at which coating breaks is reported as adhesion of coating.
UNT-30 Scratch head allows to scratch sample with various easy to interchange upper tips. Multiple insitu data such as friction, acoustic emission, down force, displacement is monitored to precisely calculate adhesion or scratch hardness value of the coating or material. The tests can be done in linear, rotary, spiral and in customize motions.
Nano scratch – upto 1000mN force.
Micro scratch – upto 30N force (upgradeable with higher range)
Common features –
Scratch in depth mode or force mode
Linear and non linear scratches
Real depth measurement pre, during and post test
Image and data on same data file
Depth measured using multiple independent capacitance or LVDT sensors
Insitu friction, acoustic emmison, depth etc. measurement
3D High Resolution Images
Inline imaging to generate atomic level images automatically
Inline imaging option to locate and image previously impossible to locate the nano indent or nano scratch marks automatically. Depending upon the test or the mechanical head installed an imaging option can be chosen. Sample automatically moves between imaging and mechanical heads.
3d High Res Images
High Magnification
Microscope
With Multiple objectives mounted on automatic or manual turret that can take high resolution colored picture and videos.
3D Contact Profilometer
Contact Stylus based profilometer with both tip and stage scan to generate 2D and 3D images with high reliability and without any material surface requirement.
Optical Profilometer
Non contact White light interferometer with high intensity LED allows to image sample with < 0.4% to 100% reflectivity.
AFM
Atomic force microscope with all standard modes such as contact and non contact mode to generate high resolution atomic scale images.
Platform Design
Sturdy design, minimal thermal drift, clean room compatible
To allow analysis at nano level, NT-30 offers cut-off environment. NT-30 is based on a strong sturdy platform that uses granite, anti dampening cast iron, optically flat reference discs, antivibration table, acoustic enclosure etc. High grade electronics from silicon valley allow for high data processing speeds. Fine finish, clean room compatible, low energy compliant, small foot print, multiple cameras, led lighting on the platform makes this platform an ideal platform for various nanotechnology studies.
Replicate any motion to bring test close to real life
It takes less than 5 minutes to interchange linear drive to a rotary drive. Multiple independent drives allows to create any motion. For eg. User can do scratch test in linear, zig zag, rotary or spiral motions.
UT-3000 uses multi sensing technology to measure various data insitu during the test. Sensors such as acoustic emission, electrical contact resistance, down force, friction force, wear, displacement, humidity, temperature, velocity, stroke lengths, motion direction, images are all recorded and saved on same data file automatically. User can change the frequency of data collection to reduce file size if needed.
A good complement to a strong platform
Real time display of displacement, force, acoustic emmision etc.
Automatic calculation of hardness, modulus etc.